公开(公告)号：US20180328986A1

公开(公告)日：2018-11-15

申请号：US15591161

申请日：2017-05-10

Applicant: Intel IP Corporation

Inventor： Baraa Al-Dabagh ,  Dongsheng Bi ,  Roi Uziel

IPC: G01R31/3177 ,  G01R31/317

Abstract: An electronic device includes one or more integrated circuits, a debugging translation block, and a bus connected to the one or more integrated circuits and the debugging translation block, the bus configured to provide a connection to one or more external devices, wherein the debugging translation block is configured to receive debugging commands from a testing host device via the bus, convert the debugging commands into debugging input data, and provide the debugging input data to a debugging state machine of a first integrated circuit of the one or more integrated circuits.

公开(公告)号：US10474515B2

公开(公告)日：2019-11-12

申请号：US15591161

申请日：2017-05-10

Applicant: Intel IP Corporation

Inventor： Baraa Al-Dabagh ,  Dongsheng Bi ,  Roi Uziel

IPC: G06F11/00 ,  G01R31/317

Abstract: An electronic device includes one or more integrated circuits, a debugging translation block, and a bus connected to the one or more integrated circuits and the debugging translation block, the bus configured to provide a connection to one or more external devices, wherein the debugging translation block is configured to receive debugging commands from a testing host device via the bus, convert the debugging commands into debugging input data, and provide the debugging input data to a debugging state machine of a first integrated circuit of the one or more integrated circuits.