公开(公告)号：US10481188B2

公开(公告)日：2019-11-19

申请号：US15874415

申请日：2018-01-18

Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Minah Seo ,  Sanghun Lee ,  Chulki Kim ,  Q-Han Park ,  Jongho Choe ,  Jinsoo Kim

IPC: G01R27/00 ,  G01R27/26 ,  G01N21/3563

Abstract: Disclosed herein is a system for non-contact measurement of an optoelectronic property. The system includes a sensing element configured to amplify an electromagnetic wave having a specific frequency, a thin film disposed on the sensing element such that an optoelectronic property of the thin film is measured, and an optoelectronic property measuring server configured to extract a physical property of the thin film based on the optoelectronic property of the thin film obtained when the electromagnetic wave amplified by the sensing element passes through the thin film.