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1.发明授权X-ray analysis system with means to detect only the coherently scattered X-rays 失效X射线分析系统具有仅检测相干散射X射线的手段
公开(公告)号：US3154684A
公开(公告)日：1964-10-27
申请号：US3796860
申请日：1960-06-22
Applicant: LAB FOR ELECTRONICS INC
Inventor： ZIEGLER CHARLES A
IPC: G01N23/203
CPC classification number: G01N23/203
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公开(公告)号：US3146347A
公开(公告)日：1964-08-25
申请号：US13390861
申请日：1961-08-25
Applicant: LAB FOR ELECTRONICS INC
Inventor： ZIEGLER CHARLES A
IPC: G01N23/225
CPC classification number: G01N23/225
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公开(公告)号：US3084062A
公开(公告)日：1963-04-02
申请号：US85231859
申请日：1959-11-12
Applicant: LAB FOR ELECTRONICS INC
Inventor： CHLECK DAVID J , ZIEGLER CHARLES A
CPC classification number: C09D5/22 , G04D3/0048
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