公开(公告)号：US20230169634A1

公开(公告)日：2023-06-01

申请号：US17923068

申请日：2020-10-14

Applicant: LG ELECTRONICS INC.

Inventor： Yi HU ,  Sangyun KIM ,  Run CUI ,  Hyunwoo KIM ,  Jaehong EOM

IPC: G06T5/50 ,  G06T3/40 ,  G06T7/00 ,  G06T5/00

CPC classification number: G06T5/50 ,  G06T3/40 ,  G06T7/0004 ,  G06T5/002 ,  G06T2207/20081 ,  G06T2207/20221 ,  G06T2207/20092 ,  G06T2207/30108

Abstract: A product inspection apparatus including a camera configured to capture an image of a product to be inspected; and a processor configured to extract defect information from a defect indicated by the captured image of the product, generate first virtual defect data including at least one of a location, a size and a shape of the defect included in the captured image, based on the extracted defect information, generate second virtual defect data by synthesizing the first virtual defect data with non-defect data representing the product without the defect, and generate final virtual defect data by inputting the second virtual defect data to an artificial intelligence generative model.