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    Light path control member, and display device comprising same
    1.
    发明授权
    Light path control member, and display device comprising same 有权

    公开(公告)号：US12153323B2

    公开(公告)日：2024-11-26

    申请号：US18260132

    申请日：2022-01-04

    Applicant: LG INNOTEK CO., LTD.

    Inventor： Jin Mi Noh ,  Byung Sook Kim ,  Ho Young Kim ,  Hyeon Ji Hong

    IPC: G02F1/16766 ,  G02F1/1333 ,  G02F1/1335 ,  G02F1/1343

    Abstract: A light path control member according to an embodiment comprises: a first substrate by which a first direction and a second direction are defined; a first electrode disposed on the first substrate; a second substrate disposed on the first substrate; a second electrode disposed under the second substrate; and a light conversion unit disposed between the first electrode and the second electrode, wherein the light conversion unit comprises: a plurality of partitions; a plurality of accommodation units; and a base, wherein the accommodation units extend in the second direction, the first electrode includes a plurality of first pattern electrodes extending in the second direction and spaced apart from each other, and the first pattern electrodes overlap the accommodation units.

    Optical path control member and display device comprising same
    2.
    发明授权
    Optical path control member and display device comprising same 有权

    公开(公告)号：US11860466B2

    公开(公告)日：2024-01-02

    申请号：US17923484

    申请日：2021-04-15

    Applicant: LG INNOTEK CO., LTD.

    Inventor： Hyeon Ji Hong ,  In Hae Lee

    IPC: G02F1/1335 ,  G02F1/1334

    CPC classification number: G02F1/133512 ,  G02F1/1334 ,  G02F1/133519

    Abstract: An optical path control member according to an embodiment comprises an adhesive layer disposed between a second electrode and a light conversion part, wherein: the light conversion part includes a partition wall part and a reception part alternately arranged; the partition wall part includes a first area from the upper surface of the partition wall part up to 30 μm in a direction toward the first substrate, a third area from the lower surface of the partition wall part up to 30 μm in a direction toward the second substrate, and a second area provided between the first area and the third area; and Si measured by XPS in the first area corresponds to 2 at % or less.

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