公开(公告)号：US06502007B1

公开(公告)日：2002-12-31

申请号：US09530019

申请日：2000-05-15

申请人： Masao Kanamoto ,  Yasushi Fukaya ,  Sadayuki Matsumiya ,  Kazuo Yamazaki

发明人： Masao Kanamoto ,  Yasushi Fukaya ,  Sadayuki Matsumiya ,  Kazuo Yamazaki

IPC分类号： G05B194093

CPC分类号： G05B19/40937 ,  Y02P90/265

摘要： In NC machining in which machining control is performed through An NC program, machining conditions at the time of actual machining are reflected in the NC program. At this time, there are two types of modes comprising an analytic storage mode in which actual machining conditions are reflected in the NC program as they are and an optimization mode in which optimization processing applies to the actual machining conditions and the result is reflected in the NC machining program, and either of them is selected according to conditions.

摘要翻译： 在通过NC程序进行加工控制的NC加工中，实际加工时的加工条件反映在NC程序中。 此时，存在两种类型的模式，包括其中实际加工条件反映在NC程序中的分析存储模式以及优化模式，其中优化处理适用于实际加工条件，并且结果反映在 NC加工程序，并根据条件选择其中任何一种。

公开(公告)号：US06917418B2

公开(公告)日：2005-07-12

申请号：US10395203

申请日：2003-03-25

申请人： Makoto Fujishima ,  Masao Kanamoto

发明人： Makoto Fujishima ,  Masao Kanamoto

IPC分类号： G01B11/00 ,  B23Q17/24 ,  G01B11/27 ,  G01B11/26

CPC分类号： G01B11/272 ,  B23Q17/24

摘要： An accuracy analyzing apparatus 1 comprises: a light projector 2 attached to a main spindle 26 for emitting a light beam having a light axis coaxial with the axis of the main spindle 26; a semitransparent mirror 3 which transmits part of the emitted light beam and reflects other part; a first imaging device 4a for receiving the transmitted light beam; a second imaging device 4b for receiving the reflected light beam; and an analyzer 10 which calculates light receiving positions in the first and second imaging devices 4a and 4b, which estimates the light receiving position where the reflected light beam is to be received by the second imaging device 4b in the case where it is assumed that the axis of the main spindle 26 coincides with the first axis, and which compares the estimated light receiving position with the calculated light receiving position to analyze the perpendicularity of the axis of the main spindle 26.

摘要翻译： 精度分析装置1包括：安装在主轴26上的光投射器2，用于发射具有与主轴26的轴线同轴的光轴的光束; 透射部分发射光束并反射其他部分的半透明镜3; 用于接收透射光束的第一成像装置4a; 用于接收反射光束的第二成像装置4b; 以及分析器10，其计算在第一和第二成像装置4a和4b中的光接收位置，其估计在第二成像装置4b的情况下由第二成像装置4b接收反射光束的光接收位置 假设主轴26的轴线与第一轴线重合，并且将估计的光接收位置与计算的光接收位置进行比较，以分析主轴26的轴线的垂直度。