公开(公告)号：US07589545B2

公开(公告)日：2009-09-15

申请号：US11711685

申请日：2007-02-28

申请人： Matthias Heinke ,  Heinrich Wieczorek

发明人： Matthias Heinke ,  Heinrich Wieczorek

IPC分类号： G01R31/02

CPC分类号： G01R31/2881 ,  G01R31/2862

摘要： A device is provided for subjecting a plurality of singulated semiconductor components to functional verification, which includes contact pins that are integrated in a test socket and establish a mechanical and electrical contact between the test socket and the integrated semiconductor circuits, a holding fixture (DUT board) connected to the test socket for transmitting electrical signals to and from a program-controlled electronic switching system, and lines and control devices for operating at least one pneumatic transport and holding device for picking up, orienting and positioning the singulated semiconductor components, an inert gas is provided as the medium for operating the pneumatic devices.

摘要翻译： 提供了一种用于对多个单片化半导体部件进行功能验证的器件，其包括集成在测试插座中并且在测试插座和集成半导体电路之间建立机械和电接触的接触针，保持夹具（DUT板 ）连接到测试插座，用于向程控电子开关系统传输电信号，以及用于操作至少一个用于拾取，定向和定位单个半导体部件的气动输送和保持装置的线和控制装置，惰性 提供气体作为用于操作气动装置的介质。

公开(公告)号：US20070205789A1

公开(公告)日：2007-09-06

申请号：US11711685

申请日：2007-02-28

申请人： Matthias Heinke ,  Heinrich Wieczorek

发明人： Matthias Heinke ,  Heinrich Wieczorek

IPC分类号： G01R31/02

CPC分类号： G01R31/2881 ,  G01R31/2862

摘要： A device is provided for subjecting a plurality of singulated semiconductor components to functional verification, which includes contact pins that are integrated in a test socket and establish a mechanical and electrical contact between the test socket and the integrated semiconductor circuits, a holding fixture (DUT board) connected to the test socket for transmitting electrical signals to and from a program-controlled electronic switching system, and lines and control devices for operating at least one pneumatic transport and holding device for picking up, orienting and positioning the singulated semiconductor components, an inert gas is provided as the medium for operating the pneumatic devices.

摘要翻译： 提供了一种用于对多个单片化半导体部件进行功能验证的器件，其包括集成在测试插座中并且在测试插座和集成半导体电路之间建立机械和电接触的接触针，保持夹具（DUT板 ）连接到测试插座，用于向程控电子开关系统传输电信号，以及用于操作至少一个用于拾取，定向和定位单个半导体部件的气动输送和保持装置的线和控制装置，惰性 提供气体作为用于操作气动装置的介质。