公开(公告)号：US09728276B2

公开(公告)日：2017-08-08

申请号：US14750102

申请日：2015-06-25

Applicant: MediaTek Inc.

Inventor： Shi-Wei Chang ,  Chia-Wei Wang

IPC: G11C7/00 ,  G11C29/44

CPC classification number: G11C29/4401

Abstract: An embodiment of the invention provides an integrated circuit including a core circuit and a memory. The core circuit executes operations of the integrated circuit. The memory stores a subsystem and a repair system. When the repair system runs, the repair system detects whether there is a defect in the memory. When the repair system detects the defect, the repair system repairs the defect, and when the repair system does not detect the defect, a fake defect is injected in the memory to verify whether the repair system runs correctly.