公开(公告)号：US20230149721A1

公开(公告)日：2023-05-18

申请号：US18056472

申请日：2022-11-17

Applicant: Medtronic, Inc.

Inventor： John C. Stroebel ,  Maureen E. Lybarger ,  Mohac Tekmen ,  Greggory R. Herr ,  John D. Golnitz ,  Kristen J. Cattin ,  Eric A. Schilling ,  Eric R. Williams ,  Teresa A. Whitman ,  Mikayle A Holm ,  Michelle M. Galarneau ,  Tara M. Treml ,  Derek W. Prusener

IPC: A61N1/37 ,  A61B5/352 ,  A61B5/358

CPC classification number: A61N1/3702 ,  A61B5/352 ,  A61B5/358

Abstract: A method includes detecting, by an implantable medical device (IMD), attachment to the IMD of at least one implantable medical lead with at least one electrode; and triggering by the IMD, based on the detecting of the attachment to the IMD of the at least one medical lead, a device test sequence in which the IMD performs the following qualification tests over an evaluation period: detecting an impedance for at least one electrical path that includes the at least one electrode to determine a connection status of the IMD to the at least one electrode; and comparing EGM (electrogram) amplitudes of the patient over an EGM test period against a predetermined threshold.