公开(公告)号：US20210372842A1

公开(公告)日：2021-12-02

申请号：US17336068

申请日：2021-06-01

Applicant: Microchip Technology Incorporated

Inventor： Lorenzo Bellina ,  Maurizio Fiammeni

IPC: G01F23/26 ,  G01D5/24

Abstract: One or more examples relate to a detector. A signal that the detector is configured to sense is a differential value. Such a differential value may be indicative of a difference in self-capacitance indications that are exhibited at first and second internal capacitors. Such a differential value may be proportional to a relationship between a first material and a second material present at a device-under-test coupled to electrodes of the detector. Such a differential value may be proportional to a vertical elevation of a surface of a material present at a device-under-test coupled to electrodes of the detector. A difference in coupling capacitances may be obtained by performing complimentary acquisition processes utilizing symmetric capacitive sensors. When the acquisition processes are performed substantially simultaneously, coupling error indications that may be present in the self-capacitance indications are not present in the differential value.

公开(公告)号：US20250003784A1

公开(公告)日：2025-01-02

申请号：US18759059

申请日：2024-06-28

Applicant: Microchip Technology Incorporated

Inventor： Lorenzo Bellina ,  Maurizio Fiammeni

IPC: G01F23/263

Abstract: Examples relate, generally, to utilizing capacitive distance measurement values to adjust capacitive liquid level measurement values.

公开(公告)号：US11860022B2

公开(公告)日：2024-01-02

申请号：US17336068

申请日：2021-06-01

Applicant: Microchip Technology Incorporated

Inventor： Lorenzo Bellina ,  Maurizio Fiammeni

IPC: G01F23/26 ,  G01F23/263 ,  G01D5/24

CPC classification number: G01F23/263 ,  G01D5/2405

Abstract: One or more examples relate to a detector. A signal that the detector is configured to sense is a differential value. Such a differential value may be indicative of a difference in self-capacitance indications that are exhibited at first and second internal capacitors. Such a differential value may be proportional to a relationship between a first material and a second material present at a device-under-test coupled to electrodes of the detector. Such a differential value may be proportional to a vertical elevation of a surface of a material present at a device-under-test coupled to electrodes of the detector. A difference in coupling capacitances may be obtained by performing complimentary acquisition processes utilizing symmetric capacitive sensors. When the acquisition processes are performed substantially simultaneously, coupling error indications that may be present in the self-capacitance indications are not present in the differential value.