公开(公告)号：US20250077390A1

公开(公告)日：2025-03-06

申请号：US18795468

申请日：2024-08-06

Applicant: NEC Corporation

Inventor： Yusuke SHIMADA ,  Shunichi KINOSHITA ,  Daiki TANAKA ,  Daichi ARAI

IPC: G06F11/36

Abstract: A backdoor inspection apparatus and the like with improved inspection accuracy of a backdoor trigger are provided. A backdoor inspection apparatus includes: an acquisition unit acquiring a program to be analyzed and starting point information of analysis; a data flow analysis unit analyzing a data flow included in the program, based on the acquired program to be analyzed and starting point information of analysis, and outputting data flow analysis information; and a conditional branch extraction unit extracting, as a candidate of a backdoor trigger, a conditional branch in which external input data are directly propagated, by using the data flow analysis information.