公开(公告)号：US20230326008A1

公开(公告)日：2023-10-12

申请号：US18188520

申请日：2023-03-23

Applicant: NGK INSULATORS, LTD.

Inventor： Takafumi TERAHAI ,  Yoshihiro SATO ,  Kai YAMASHITA

IPC: G06T7/00 ,  G06T7/60

CPC classification number: G06T7/0004 ,  G06T7/60 ,  G06T2207/20081

Abstract: Excessive detections of a defect(s) of a specified defect type is reduced. A test apparatus: inputs each of a plurality of fragment images, which are extracted from a test image of a work, into a learning model which receives an image(s) as input and outputs a type(s), and thereby judges the type with respect to each of the plurality of fragment images. The test apparatus judges whether or not a defect of a specified defect type is captured in the test image, on the basis of whether the judged type with respect to each of the plurality of fragment images is the specified defect type or not.