公开(公告)号：US10924741B2

公开(公告)日：2021-02-16

申请号：US16384907

申请日：2019-04-15

Applicant: NOVATEK Microelectronics Corp.

Inventor： Fandi Jou

IPC: H04N19/89 ,  H04N19/176 ,  H04N19/126 ,  H04N19/139 ,  H04N19/189

Abstract: A method of determining quantization parameters includes the steps of: receiving a block of image data; calculating a general variance of the block of image data; calculating a plane-based variance of the block of image data by subtracting an image moment of the block of image data from the general variance; and determining a quantization parameter for the block of image data according to the plane-based variance.

公开(公告)号：US20200329244A1

公开(公告)日：2020-10-15

申请号：US16384907

申请日：2019-04-15

Applicant: NOVATEK Microelectronics Corp.

Inventor： Fandi Jou

IPC: H04N19/126 ,  H04N19/139 ,  H04N19/89 ,  H04N19/189 ,  H04N19/176

Abstract: A method of determining quantization parameters includes the steps of: receiving a block of image data; calculating a general variance of the block of image data; calculating a plane-based variance of the block of image data by subtracting an image moment of the block of image data from the general variance; and determining a quantization parameter for the block of image data according to the plane-based variance.