公开(公告)号：US20140002115A1

公开(公告)日：2014-01-02

申请号：US14014395

申请日：2013-08-30

Applicant: Novatek Microelectronics Corp.

Inventor： Ching-Chun Lin ,  Wing-Kai Tang ,  Ching-Ho Hung ,  Tsen-Wei Chang ,  Yi-Liang Lin ,  Jiun-Jie Tsai

IPC: G01R27/26

CPC classification number: G01R27/2605 ,  G01R27/26

Abstract: A capacitance sensing method is provided. The capacitance sensing method includes the following steps. During at least one first period of a sensing period, a capacitance under test is sensed through a first sensing channel, and a reference capacitance is sensed through a second sensing channel. During at least one second period of the sensing period, the reference capacitance is sensed through the first sensing channel, and the capacitance under test is sensed through the second sensing channel. A first difference is generated according to the capacitance under test and the reference capacitance.

Abstract translation: 提供电容感测方法。 电容感测方法包括以下步骤。 在感测周期的至少一个第一周期期间，通过第一感测通道来感测被测电容，并且通过第二感测通道感测参考电容。 在感测周期的至少一个第二周期期间，通过第一感测通道感测参考电容，并且通过第二感测通道感测被测电容。 根据被测电容和参考电容产生第一个差异。