DEFECT CLOSURE
    1.
    发明申请
    DEFECT CLOSURE 审中-公开
    缺陷闭合

    公开(公告)号:US20130007526A1

    公开(公告)日:2013-01-03

    申请号:US13173834

    申请日:2011-06-30

    IPC分类号: G06F11/07

    CPC分类号: G06F11/3688

    摘要: A method, computer program product, and system for defect closure is described. A method may allowing, via one or more computing devices, a user to define one or more parameters associated with a defect. The method may further comprise modifying, via the one or more computing devices, a care-value associated with the defect, as a function of time, based upon, at least in part, the one or more parameters defined by the user. The method may additionally comprise, in response to determining that the defect is unresolved after a configurable time period, closing, via the one or more computing devices, the defect.

    摘要翻译: 描述了一种用于缺陷闭合的方法,计算机程序产品和系统。 方法可以经由一个或多个计算设备允许用户定义与缺陷相关联的一个或多个参数。 该方法还可以包括至少部分地基于由用户定义的一个或多个参数,经由一个或多个计算设备修改与该缺陷相关联的护理值作为时间的函数。 该方法可以另外包括响应于确定在可配置时间段之后该缺陷未被解决,经由一个或多个计算设备关闭该缺陷。