公开(公告)号：US20140126805A1

公开(公告)日：2014-05-08

申请号：US13842921

申请日：2013-03-15

Applicant: QUANTA COMPUTER INC.

Inventor： Chin-Lin LIN

IPC: G01N21/956

CPC classification number: G06T7/001 ,  G06T2207/30164

Abstract: An optical inspection method including the following steps is disclosed. A tester is utilized to obtain an image of an inspection object. A target image region of the image is determined. Multiple central coordinates of multiple inspection ranges of a target image region are obtained. The central coordinates are filled to an array, and then the central coordinates are reordered according to relative relationships of the central coordinates to obtain a reordered coordinate array. The reordered coordinate array is compared with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.

Abstract translation: 公开了包括以下步骤的光学检查方法。 使用测试仪来获得检查对象的图像。 确定图像的目标图像区域。 获得目标图像区域的多个检查范围的多个中心坐标。 将中心坐标填充到阵列中，然后根据中心坐标的相对关系重新排列中心坐标，以获得重新排列的坐标数组。 将重新排序的坐标数组与原始坐标数组进行比较，以检查与检查范围相对应的检查对象的部件是否遗漏。