SURFACE OR INTERFACE DEFECT DETECTION
    1.
    发明申请

    公开(公告)号:US20190277778A1

    公开(公告)日:2019-09-12

    申请号:US16270152

    申请日:2019-02-07

    Abstract: A method of detecting defects on a surface or interface of a part is provided. The method includes: providing data from an X-ray scan of the part; processing the scan data to obtain an original 3D or 2D model of a surface or interface topology of the part; and filtering the original 3D or 2D model of the surface or interface topology to identify deviations from the expected surface or interface topology of the part. The identified deviations may be produced by surface or interface defects on the part.

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