Method for testing electronic components
    1.
    发明授权
    Method for testing electronic components 失效
    电子元件测试方法

    公开(公告)号:US07388390B2

    公开(公告)日:2008-06-17

    申请号:US11782927

    申请日:2007-07-25

    IPC分类号: G01R31/02

    CPC分类号: G01R31/01

    摘要: A testing apparatus is described with a housing, a power source, a carrier assembly, and a backbone connecting the carrier assembly to the power source. A resource board is disposed on the carrier assembly and is connected thereto, thereby receiving power from the power source through the carrier assembly. The resource board is adapted to perform a test on a device under test and to generate data reflecting results of the test on the device under test. A test pin assembly is disposed at one end of the resource board and is connectable with a loadboard. A controller operatively connects to the power supply, the carrier assembly, and the resource board. The controller is adapted to communicate with the resource board to execute instructions to test the device under test. The controller also receives the result data from the resource board, permitting analysis of the device under test.

    摘要翻译: 使用壳体,电源,载体组件和将载体组件连接到电源的骨干来描述测试装置。 资源板被布置在载体组件上并与其连接,从而通过载体组件从电源接收电力。 资源板适于对被测设备进行测试,并生成反映被测设备上测试结果的数据。 测试销组件设置在资源板的一端,并且可与装载板连接。 控制器可操作地连接到电源,载体组件和资源板。 控制器适于与资源板进行通信,以执行测试被测设备的指令。 控制器还从资源板接收结果数据,允许对被测设备进行分析。