公开(公告)号：US20230056595A1

公开(公告)日：2023-02-23

申请号：US17690310

申请日：2022-03-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sangkyu PARK ,  Junwoo SONG ,  Jaecheol LEE ,  Youngbum HUR ,  Sangdo PARK ,  Jinwon AN ,  Baejin LEE ,  Jun Haeng LEE

IPC: G05B23/02 ,  G06N3/04 ,  G06N3/08 ,  G06K9/62

Abstract: A method and device for predicting an anomaly in a manufacturing process. The method includes receiving time-series equipment data including one or both of sensor data and specification data, converting the time-series equipment data into an image, dividing the image into a plurality of patch images, outputting a probability for each class associated with a sign of an anomaly in the time-series equipment data by inputting the plurality of patch images to a pretrained artificial neural network (ANN), and predicting the sign of the anomaly in the time-series equipment data by adjusting a probability weight for each class based on a preset standard.