公开(公告)号：US20240046151A1

公开(公告)日：2024-02-08

申请号：US18305712

申请日：2023-04-24

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sukhdeep SINGH ,  Vivek SAPRU ,  Joseph THALIATH ,  Ganesh Kumar THANGAVEL ,  Ashish JAIN ,  Seungil YOON ,  Hoejoo LEE ,  Hunje YEON

IPC: G06N20/00

CPC classification number: G06N20/00

Abstract: A system and/or method for automated ML model retraining by an electronic device. The system and/or method may include one or more of: running a first ML model and a second ML model, predicting an accuracy degradation of the first ML model using the second ML model, determining whether the predicted accuracy degradation meets a pre-defined threshold, and/or retraining the first ML model when the predicted accuracy degradation meets the pre-defined threshold.