公开(公告)号：US20180136907A1

公开(公告)日：2018-05-17

申请号：US15404826

申请日：2017-01-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Karpinskyy BOHDAN ,  Yong-ki LEE ,  Mi-jung NOH ,  Sang-wook PARK ,  Ki-tak KIM ,  Yong-Soo KIM ,  Yun-hyeok CHOI

IPC: G06F7/58

CPC classification number: G06F7/584 ,  G06F7/58

Abstract: An apparatus for testing a random number generator includes a correlation test circuit and a randomness determination circuit. The correlation test circuit extracts a first plurality of bit pairs each including two bits spaced apart from each other by a first distance in a bit stream generated by the random number generator, obtains a first sum of differences between respective two bits of the first plurality of bit pairs, and obtains a second sum of differences between respective two bits of a second plurality of bit pairs, the second plurality of bit pairs each including two bits spaced apart from each other by a second distance, different from the first distance, in the bit stream. The randomness determination circuit determines a randomness of the bit stream, based on the first sum and the second sum.