公开(公告)号：US11269321B2

公开(公告)日：2022-03-08

申请号：US16291419

申请日：2019-03-04

申请人： SAMSUNG ELECTRONICS CO., LTD.

发明人： Kyoung-whan Oh ,  Ho-youl Lee ,  Won-ki Park ,  Jong-hwi Seo ,  Young-il Jang ,  Ha-nock Kwak ,  Byoung-tak Zhang ,  Seong-ho Choi

IPC分类号： G05B23/02 ,  G06F17/14 ,  G06N3/04

摘要： An equipment diagnosis system and method, which use abnormal data and normal data of equipment and accurately and effectively perform diagnosis on the equipment, are provided. The equipment diagnosis system includes a data acquisition unit to acquire time series data of equipment, a preprocessing unit convert the time series data into frequency data including a temporal component through a Fourier transform, a deep learning unit to perform deep learning through a convolution neural network (CNN) by using the frequency data, and a diagnosis unit to determine a state of the equipment to be a normal state or a breakdown state based on the deep learning.