公开(公告)号：US11002710B2

公开(公告)日：2021-05-11

申请号：US16329244

申请日：2018-02-11

Applicant: SOUTHEAST UNIVERSITY

Inventor： Zaifa Zhou ,  Chao Sun ,  Xinge Guo ,  Qingan Huang

IPC: G01N29/12 ,  G01N3/02 ,  G01N29/24 ,  G01N3/00

Abstract: A method for measuring mechanical parameters of a multilayer composite thin film structure and belongs to the technical field of online tests of micro-electro-mechanical system (MEMS for short) material parameters. Equivalent Young modulus and equivalent residual stress of each layer of the multilayer composite thin film structure can be obtained in one step by means of solving an equation set on the basis of a relationship between first-order resonance frequency of multilayer composite fixed-fixed beams and multilayer composite cantilever beams and parameters such as material characteristics and structure size, the online test of multilayer thin film materials can be realized, the test structure and calculating method are simple, and the accuracy is higher. The present invention further discloses a device for measuring mechanical parameters of the multilayer composite thin film structure.