公开(公告)号：US20190273484A1

公开(公告)日：2019-09-05

申请号：US16296094

申请日：2019-03-07

Applicant: STMICROELECTRONICS INTERNATIONAL N.V.

Inventor： Alok Kumar TRIPATHI ,  Amit VERMA ,  Anuj GROVER ,  Deepak Kumar BIHANI ,  Tanmoy ROY ,  Tanuj AGRAWAL

IPC: H03K3/3562 ,  G11C29/00

Abstract: The present disclosure is directed to a master-slave flip-flop memory circuit having a partial pass gate transistor at the input of the master latch. The partial pass gate transistor includes a pull-up clock enabled transistor for selectively coupling a high output of a test switch to the input of the master latch. The input of the master latch is also directly coupled to a low output of the test switch around the partial pass gate. In addition, a revised circuit layout is provided in which the master latch has three inverters. A first inverter is coupled to the input of the master latch. Second and third inverters are coupled to an output of the first inverter, with the second inverter having an output coupled to the input of the first inverter, and the third inverter having an output coupled to an output of the master latch. The first and second inverters are clock enabled, and the third inverter is reset enabled.

公开(公告)号：US20190018062A1

公开(公告)日：2019-01-17

申请号：US16031960

申请日：2018-07-10

Applicant: STMICROELECTRONICS SA ,  STMICROELECTRONICS (CROLLES 2) SAS ,  STMICROELECTRONICS INTERNATIONAL N.V.

Inventor： Pascal URARD ,  Florian CACHO ,  Vincent HUARD ,  Alok Kumar TRIPATHI

IPC: G01R31/3183 ,  G01R31/3185 ,  G01R31/3177 ,  G01R31/317 ,  G01R31/3181

CPC classification number: G01R31/318342 ,  G01R31/31725 ,  G01R31/3177 ,  G01R31/31816 ,  G01R31/318541 ,  G01R31/318552 ,  G01R31/318594 ,  G06F17/5031

Abstract: A flip flop includes a data input, a clock input, a test chain input, a test chain output, a monitoring circuit, and an alert transmission circuit. The monitoring circuit is adapted to generate an alert if the time between arrival of a data bit and a clock edge is less than a threshold. The alert transmission circuit is adapted to apply during a monitoring phase an alert level to the test chain output in the event of an alert generated by the monitoring circuit, and to apply the alert level to the test chain output when an alert level is received at the test chain input.