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公开(公告)号:US11353508B2
公开(公告)日:2022-06-07
申请号:US17031713
申请日:2020-09-24
Applicant: STMICROELECTRONICS SA
Inventor: Ricardo Gomez Gomez
IPC: G01R31/3185 , G01R31/3177 , G06F11/267 , G06F11/16 , G06F11/18 , G01R31/3181
Abstract: A method tests a plurality of devices, each device including a test chain having a plurality of positions storing test data. The testing includes comparing test data in a last position of the test chain of each of the devices. The test data in the test chains of the devices is shifted forward by one position. The shifting includes writing test data in the last position of a test chain to a first position in the test chain. The comparing and the shifting are repeated until the test data in the last position of each test chain when the testing is started is shifted back into the last position of the respective test chain. The plurality of devices may have a same structure and a same functionality.
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公开(公告)号:US11385288B2
公开(公告)日:2022-07-12
申请号:US17031716
申请日:2020-09-24
Applicant: STMICROELECTRONICS SA
Inventor: Ricardo Gomez Gomez , Sylvain Clerc
IPC: G01R31/317 , G01R31/3185 , G06F11/16 , G06F11/267 , G01R31/319 , G01R31/3193 , G06F11/18
Abstract: A method tests at least three devices, each device including a test chain having a plurality of positions storing test data. The testing includes comparing test data in a last position of the test chain of each of the devices, and shifting test data in the test chains of each of the devices and storing a result of the comparison in a first position of the test chains of each of the devices. The comparing and the shifting and storing are repeated until all the stored test data has been compared. The at least three devices may have a same functionality and a same structure.
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