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1.
公开(公告)号:US20200014914A1
公开(公告)日:2020-01-09
申请号:US16502483
申请日:2019-07-03
Inventor: Lookah CHUA , Jansen Reyes DUEY , Tarek LULE , Mathieu THIVIN
IPC: H04N17/00 , H04N5/369 , H04N5/3745
Abstract: An electronic device includes an array of image pixels, with the array of image pixels having inputs coupled to control lines and outputs coupled to output lines, and at least one array of dummy pixels, with the at least one array of dummy pixels having inputs coupled to the control lines. Each dummy pixel of the at least one array of dummy pixels is configured to provide a certain output signal in an absence of a fault with at least one of the control lines or of a fault with at least one of the output lines, such that a lack of output of the certain output signal by one or more of the dummy pixels of the at least one array of dummy pixels indicates the fault.
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公开(公告)号:US20220264082A1
公开(公告)日:2022-08-18
申请号:US17736504
申请日:2022-05-04
Applicant: STMicroelectronics Asia Pacific Pte Ltd
Inventor: Hong Chean CHOO , Lookah CHUA , Wai Yin HNIN
Abstract: An electronic device includes a pixel array having a plurality of rows with active imaging pixels, and at least one row with test pixels. Each of the test pixels includes a test voltage generation circuit generating a test voltage, a switching circuit receiving the test voltage and an image pixel output signal and passing the test voltage as output when in a test mode, a comparison circuit receiving the output from the switching circuit and an analog to digital conversion signal and asserting a counter reset signal when the output from the switching circuit and the analog to digital conversion signal are equal in voltage, and a counter beginning counting at a beginning of each test cycle within the test mode, stopping counting upon assertion of the counter reset signal, and outputting its count upon stopping counting. The count is proportional to the test voltage when in the test mode.
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3.
公开(公告)号:US20200045303A1
公开(公告)日:2020-02-06
申请号:US16514695
申请日:2019-07-17
Applicant: STMicroelectronics Asia Pacific Pte Ltd
Inventor: Hong Chean CHOO , Lookah CHUA , Wai Yin HNIN
Abstract: An electronic device includes a test voltage generation circuit to generate a test voltage as a function of a regulator voltage, and a switching circuit to receive the test voltage and an image pixel output signal, and to pass the test voltage as output when in a test mode. A comparison circuit receives the output from the switching circuit and an analog to digital conversion signal, and asserts a counter reset signal when the output from the switching circuit and the analog to digital conversion signal are equal in voltage. A counter begins counting at a beginning of each test cycle within the test mode, stops counting upon assertion of the counter rest signal, and outputs its count upon stopping counting. The count is proportional to the test voltage when in the test mode.
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