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公开(公告)号:US12243937B2
公开(公告)日:2025-03-04
申请号:US17711597
申请日:2022-04-01
Inventor: Matthieu Nongaillard , Thomas Oheix
IPC: H01L29/778 , H01L27/12 , H01L29/20 , H01L29/205 , H01L29/872
Abstract: The disclosure concerns a device which comprises a stack of two high electron mobility transistors, referred to as first and second transistor, separated by an insulating layer and each provided with a stack of semiconductor layers respectively referred to as first stack and second stack, the first and the second stack each comprising, from the insulating layer to, respectively, a first and a second surface, a barrier layer and a channel layer, the first and the second transistor respectively comprising a first set of electrodes and a second set of electrodes, the first and the second set of electrodes each comprising a source electrode, a drain electrode, and a gate electrode which are arranged so that the first and the second transistor are electrically connected head-to-tail.
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公开(公告)号:US12249644B2
公开(公告)日:2025-03-11
申请号:US17058117
申请日:2019-05-07
Applicant: STMicroelectronics International N.V.
Inventor: Matthieu Nongaillard , Thomas Oheix
IPC: H01L29/778 , H01L29/10 , H01L29/20
Abstract: An enhancement-mode high-electron-mobility transistor comprises a structure including a stack made of III-V semiconductor materials defining an interface and capable of forming a conduction layer in the form of a two-dimensional electron gas layer; a source electrode and a drain electrode forming an electrical contact with the conduction layer; and a gate electrode arranged on top of the structure, between the source electrode and the drain electrode. The structure comprises a bar that is arranged below the gate electrode and passes through the interface of the stack. The bar comprises two semiconductor portions exhibiting opposite types of doping, defining a p-n junction in proximity to the interface.
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