公开(公告)号：US20230243886A1

公开(公告)日：2023-08-03

申请号：US17592171

申请日：2022-02-03

Applicant: STMicroelectronics S.r.l.

Inventor： Filippo Colombo

IPC: G01R31/316 ,  G01R31/317

CPC classification number: G01R31/316 ,  G01R31/31704

Abstract: An integrated circuit (IC) includes: a first functional analog pin or pad; a first analog test bus coupled to the first functional analog pin or pad; first and second analog circuits coupled to the first analog test bus; and a test controller configured to: when the IC is in a functional operating mode, connect an input or output of the first analog circuit to the first analog test bus so that the input or output of the first analog circuit is accessible by the first functional analog pin or pad, and keep disconnected an input or output of the second analog circuit from the first analog test bus, and when the IC is in a test mode, selectively connect the input or output of the first and second analog circuits to the first analog test bus to test the first and second analog circuits using the first analog test bus.

公开(公告)号：US12135351B2

公开(公告)日：2024-11-05

申请号：US17592171

申请日：2022-02-03

Applicant: STMicroelectronics S.r.l.

Inventor： Filippo Colombo

IPC: G01R31/316 ,  G01R31/317

Abstract: An integrated circuit (IC) includes: a first functional analog pin or pad; a first analog test bus coupled to the first functional analog pin or pad; first and second analog circuits coupled to the first analog test bus; and a test controller configured to: when the IC is in a functional operating mode, connect an input or output of the first analog circuit to the first analog test bus so that the input or output of the first analog circuit is accessible by the first functional analog pin or pad, and keep disconnected an input or output of the second analog circuit from the first analog test bus, and when the IC is in a test mode, selectively connect the input or output of the first and second analog circuits to the first analog test bus to test the first and second analog circuits using the first analog test bus.