公开(公告)号：US20210110746A1

公开(公告)日：2021-04-15

申请号：US17036388

申请日：2020-09-29

Applicant: Samsung Display Co., Ltd.

Inventor： Gyunsoo KIM ,  Kijong KIM ,  MINKI KIM ,  Seung Hwan BAEK ,  In-Su BAEK ,  MINSOO SHIN

IPC: G09G3/00 ,  H01L27/32

Abstract: A display module testing method includes preparing a display module, a first circuit connected to the display module, and a second circuit connected to the display module and connected to a guide part, disposing the first circuit on a first mounting part of a stage, disposing the second circuit and the guide part on the first circuit and a second mounting part adjacent to the first mounting part of the stage, testing the display module, and removing the guide part from the second circuit.