SYSTEM AND METHOD FOR IDENTIFYING MANUFACTURING DEFECTS

    公开(公告)号:US20210096530A1

    公开(公告)日:2021-04-01

    申请号:US16693101

    申请日:2019-11-22

    Abstract: A system and method for classifying products manufactured via a manufacturing process. A processor receives an input dataset, and extracts features of the input dataset at two or more levels of abstraction. The processor combines the extracted features and provides the combined extracted features to a classifier. The classifier is trained based on the combined extracted features for learning a pattern of not-faulty products. The trained classifier is configured to receive data for a product to be classified, to output a prediction for the product based on the received data.

    SYSTEMS AND METHODS FOR IDENTIFYING MANUFACTURING DEFECTS

    公开(公告)号:US20220343140A1

    公开(公告)日:2022-10-27

    申请号:US17317806

    申请日:2021-05-11

    Abstract: Systems and method for classifying manufacturing defects are disclosed. A first machine learning model is trained with a training dataset, and a data sample that satisfies a criterion is identified from the training dataset. A second machine learning model is trained to learn features of the data sample. When an input dataset that includes first and second product data is received, the second machine learning model is invoked for predicting confidence of the first and second product data based on the learned features of the data sample. In response to predicting the confidence of the first and second product data, the first product data is removed from the dataset, and the first machine learning model is invoked for generating a classification based the second product data.

    MACHINE LEARNING SYSTEMS AND METHODS FOR CLASSIFICATION

    公开(公告)号:US20240127030A1

    公开(公告)日:2024-04-18

    申请号:US18109710

    申请日:2023-02-14

    CPC classification number: G06N3/042 G06N5/01

    Abstract: A classification system includes: one or more processors; and memory including instructions that, when executed by the one or more processors, cause the one or more processors to: calculate reference Shapley values for features of a data sample based on a first classification model; and train a second classification model though multi-task distillation to: predict Shapley values for the features of the data sample based on the reference Shapley values and a distillation loss; and predict a class label for the data sample based on the predicted Shapley values and a ground truth class label for the data sample.

    SYSTEMS AND METHODS FOR SAMPLE GENERATION FOR IDENTIFYING MANUFACTURING DEFECTS

    公开(公告)号:US20220374720A1

    公开(公告)日:2022-11-24

    申请号:US17367179

    申请日:2021-07-02

    Abstract: Systems and methods for classifying products are disclosed. A first data sample having a first portion and a second portion is identified from a training dataset. A first mask is generated based on the first data sample, where the first mask is associated with the first portion of the first data sample. A second data sample is generated based on a noise input. The first mask is applied to the second data sample for outputting a third portion of the second data sample. The third portion of the second data sample is combined with the second portion of the first data sample for generating a first combined data sample. Confidence and classification of the first combined data sample are predicted. The first combined data sample is added to the training dataset in response to predicting the confidence and the classification.

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