公开(公告)号：US20140222360A1

公开(公告)日：2014-08-07

申请号：US14174375

申请日：2014-02-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-Ho LIM ,  Sang-Ho LEE ,  Chea-Ok KO ,  Jong-Wan SHIM ,  Jeong-Nam CHEON

IPC: G01R19/00 ,  G06F17/14

CPC classification number: G01R19/0092

Abstract: A method of extracting an Integrated Circuit (IC) current is provided. The method includes generating a transfer function value by using a voltage measured in a node nearest an input terminal of the IC, substituting the generated transfer function value for a reverse fast Fourier transform function, so as to extract the IC voltage, and extracting the IC current from the extracted IC voltage through a simulation in a time domain.

Abstract translation: 提供一种提取集成电路（IC）电流的方法。 该方法包括通过使用最靠近IC输入端的节点中测量的电压来代替传递函数值，将产生的传递函数值代入反向快速傅里叶变换函数，以提取IC电压，并提取IC 通过在时域中的模拟，提取IC电压的电流。