公开(公告)号：US11094073B2

公开(公告)日：2021-08-17

申请号：US16175773

申请日：2018-10-30

Applicant: Samsung Electronics Co., Ltd.

Inventor： Andrii Volochniuk ,  Yong-Chan Keh ,  Jung-Kee Lee ,  Sung-Soon Kim ,  Sun-Kyung Kim ,  Andrii But ,  Andrii Sukhariev ,  Dmytro Vavdiyuk ,  Konstantin Morozov

IPC: G06T7/521 ,  G06K9/20 ,  H04N5/33 ,  G06K9/62

Abstract: A method of calculating depth information for a three-dimensional (3D) image includes generating a pattern based on the value of at least one cell included in a two-dimensional (2D) image, projecting the pattern, capturing a reflected image of the pattern, and calculating depth information based on the reflected image of the pattern.