公开(公告)号：US20240005476A1

公开(公告)日：2024-01-04

申请号：US18141690

申请日：2023-05-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Min Su KANG ,  Jang Hoon Kim ,  Woo Jin Jung

IPC: G06T7/00 ,  G06T7/13

CPC classification number: G06T7/0006 ,  G06T7/13 ,  G06T2207/10061 ,  G06T2207/30148

Abstract: An image processing system, including an input interface configured to receive a first direction image corresponding to a view of a semiconductor device in a first direction, and a second direction image corresponding to a view of the semiconductor device in a second direction which intersects the first direction at a first height at which the first direction image is generated; a processor configured to perform an edge detection operation for detecting an edge based on the first direction image, and to perform an image binarization operation on the first direction image; and a learning device configured to compare a first line width obtained based on the image binarization operation, and a second line width obtained based on the second direction image through machine learning, and to learn a condition of the image binarization operation which maximizes a correlation between the first line width and the second line width.