公开(公告)号：US20150317233A1

公开(公告)日：2015-11-05

申请号：US14699564

申请日：2015-04-29

Applicant: Samsung Electronics Co., Ltd.

Inventor： Vrind TUSHAR ,  Raju Udava SIDDAPPA ,  Venkata Raju INDUKURI ,  Dae-Sop PARK ,  Jae-Kyu LEE ,  Sang-Il CHOI ,  Seok-Min HWANG

IPC: G06F11/36

CPC classification number: G06F11/3636 ,  G06F11/366 ,  G06F11/3664

Abstract: An apparatus and a method for maximizing debugging performance and reducing memory overhead are provided. The method includes generating a debug protocol packet and transmitting the generated debug protocol packet to a diagnostic device. The debug protocol packet includes reference information for at least one string associated with a debug trace.

Abstract translation: 提供了一种用于最大化调试性能并减少内存开销的设备和方法。 该方法包括生成调试协议分组并将生成的调试协议分组发送到诊断设备。 调试协议分组包括至少一个与调试跟踪相关联的字符串的参考信息。