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公开(公告)号:US12158671B2
公开(公告)日:2024-12-03
申请号:US18352288
申请日:2023-07-14
Inventor: Qunfang Liang , Yani Chen , Kang Lu
IPC: G02F1/1343 , G02F1/1333 , G02F1/1335 , G02F1/13357 , G02F1/1337 , G02F1/1362
Abstract: A display panel and a display device are provided. The display panel includes a first substrate and the second substrate disposed oppositely, a plurality of liquid crystal molecules disposed between the first substrate and the second substrate, a plurality of pixel electrodes, a plurality of light-shielding electrodes and a plurality of auxiliary electrodes disposed on a same layer as the pixel electrodes. A first gap is defined between adjacent ones of the pixel electrodes, each light-shielding electrode is correspondingly disposed in a spacing. Each auxiliary electrode is located between an adjacent pixel electrode and a light-shielding electrode, a voltage applied to each auxiliary electrode is equal to a voltage applied to corresponding pixel electrode. An electric field is formed between the auxiliary electrode and the corresponding light-shielding electrode.
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公开(公告)号:US20230411532A1
公开(公告)日:2023-12-21
申请号:US17814519
申请日:2022-07-24
Inventor: Qunfang Liang
IPC: H01L29/786
CPC classification number: H01L29/78696 , H01L29/78609
Abstract: A thin film transistor (TFT) device is provided. The TFT device includes a substrate, a semiconductor channel layer, an ohmic contact layer, and a source-drain layer that are sequentially arranged on one side of the substrate. In the channel region, a compensation pattern is disposed on a surface of the semiconductor channel layer away from the substrate. The compensation pattern and the semiconductor channel layer are different types of semiconductors. By disposing the compensation pattern on the surface of the semiconductor channel layer away from the substrate, the compensation pattern and the semiconductor channel layer are different types of semiconductors, the compensation pattern can further improve a conductivity of a PNP structure, or the compensation pattern can further reduce a leakage current of a NPN structure.
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