METHOD AND DEVICE FOR THE DETECTION IN PARTICULAR OF REFRACTING DEFECTS
    1.
    发明申请
    METHOD AND DEVICE FOR THE DETECTION IN PARTICULAR OF REFRACTING DEFECTS 有权
    用于检测特定缺陷的方法和装置

    公开(公告)号:US20160334340A1

    公开(公告)日:2016-11-17

    申请号:US15111493

    申请日:2015-01-21

    Applicant: TIAMA

    CPC classification number: G01N21/90

    Abstract: The invention relates to a method of inspecting containers (3) moving between a linear camera and a light source (7) presenting continuous variation of light intensity with a periodic pattern (71) along at least one variation direction (D). According to the invention: for each movement increment of the container, a sequence of N successive image lines of the container is acquired cyclically so that for each image line: the container (3) is illuminated by the light source (7); the image line of the container is acquired; and the periodic pattern (71) is shifted for the next line along the variation direction (D); for each increment of the container (3), at least one phase image line is calculated; and the phase image lines (LP(k)) are analyzed.

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