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公开(公告)号:US20210186652A1
公开(公告)日:2021-06-24
申请号:US17196565
申请日:2021-03-09
Applicant: TOPPAN PRINTING CO., LTD.
Inventor: Junya TANABE , Ryohei TODE , Saeko NOMURA , Tsukasa YAMAZAKI , Ryo SHODA , Hiroyoshi NISHIYAMA
Abstract: An examination marker is used in diagnostic imaging using microwaves, including a marker body to be adhered to a site to be examined. The marker body is configured to display an index used for scanning of the site to be examined and to deform in accordance with a shape of the site to be examined, and the marker body has a transmittance of 70% or higher to microwaves at a frequency of 2 GHz.