公开(公告)号：US20250085346A1

公开(公告)日：2025-03-13

申请号：US18828799

申请日：2024-09-09

Applicant: Texas Instruments Incorporated

Inventor： Abhishek Chaudhary ,  Grant Ford ,  Rubin A. Parekhji ,  Edward C. Suder

IPC: G01R31/3185

Abstract: Methods and apparatus for boundary scan. In one example, a circuit includes at least one first input/output (I/O) device, at least one boundary scan element coupled to the at least one first I/O device, and at least one second I/O device coupled to the at least one boundary scan element. The circuit may further include a test controller coupled to the at least one boundary scan element and configured to control the at least one boundary scan element to drive the at least one first I/O device and the at least one second I/O device with a binary test signal.