Defect centre-based sensor
    2.
    发明授权

    公开(公告)号:US11852701B2

    公开(公告)日:2023-12-26

    申请号:US17427127

    申请日:2020-01-29

    CPC classification number: G01R33/24 G01R33/445 G02B6/32 G02B6/4204

    Abstract: A defect centre-based sensor is disclosed. The sensor comprises instrumentation which includes a generator for causing excitation in an active element, for example a diamond, and a detector for measuring a transition in the active element. The generator is an optical source and/or the detector is an optical detector. The sensor further comprises an optical waveguide and a sensor head in communication with the source and/or the detector via the optical waveguide. The sensor head houses the active element having at least one defect centre, for example, a nitrogen vacancy, responsive to an applied magnetic field, electric field or temperature and a signal delivery arrangement, for example at least one lens, arranged to optically couple the optical waveguide to the active element.

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