公开(公告)号：US20220248953A1

公开(公告)日：2022-08-11

申请号：US17623629

申请日：2020-06-01

Applicant: Topcon Corporation

Inventor： Hitoshi SHIMIZU ,  Kazuhiro OMORI ,  Hisashi TSUKADA

IPC: A61B3/135 ,  A61B3/14 ,  A61B3/117

Abstract: A slit lamp microscope of an aspect example includes a scanner, a controller, and an image set creation processor. The scanner is configured to scan an anterior segment of a subject's eye with slit light to collect an image group. The controller is configured to control the scanner to apply two or more scans to the anterior segment. The image set creation processor is configured to create an image set by selecting a series of images corresponding to a scan area from two or more image groups collected by the scanner in the two or more scans.

公开(公告)号：US20230157542A1

公开(公告)日：2023-05-25

申请号：US18010469

申请日：2021-05-13

Applicant: Topcon Corporation

Inventor： Hitoshi SHIMIZU ,  Kazuhiro OMORI ,  Hisashi TSUKADA

IPC: A61B3/135 ,  A61B3/117

CPC classification number: A61B3/135 ,  A61B3/117

Abstract: A slit lamp microscope according to an embodiment example includes a scanner, a first assessing processor, and a controller. The scanner is configured to perform application of a scan to an anterior segment of a subject’s eye with slit light to collect an image group. The first assessing processor is configured to execute an assessment of a quality of the image group collected by the scanner. The controller is configured to selectively execute at least two control modes according to a result of the assessment of the quality obtained by the first assessing processor.