公开(公告)号：US20220291982A1

公开(公告)日：2022-09-15

申请号：US17374682

申请日：2021-07-13

Applicant: VMware, Inc.

Inventor： Arnak Poghosyan ,  Ashot Nshan Harutyunyan ,  Naira Movses Grigoryan ,  Clement Pang ,  George Oganesyan ,  Karen Avagyan

IPC: G06F11/07

Abstract: Computer-implemented methods and systems described herein perform intelligent sampling of application traces generated by an application. Computer-implemented methods and systems determine different sampling rates based on frequency of occurrence of normal traces and erroneous traces of the application. The sampling rates for low frequency normal and erroneous traces are larger than the sampling rates for high frequency normal and erroneous traces. The relatively larger sampling rates for low frequency trace ensures that low frequency traces are sampled in sufficient numbers and are not passed over during sampling of the application traces. The sampled normal and erroneous traces are stored in a data storage device.

公开(公告)号：US20220283924A1

公开(公告)日：2022-09-08

申请号：US17367490

申请日：2021-07-05

Applicant: VMware, Inc.

Inventor： Arnak Poghosyan ,  Ashot Nshan Harutyunyan ,  Naira Movses Grigoryan ,  Clement Pang ,  George Oganesyan ,  Karen Avagyan

IPC: G06F11/34 ,  G06F11/07

Abstract: Computer-implemented methods and systems described herein perform intelligent sampling of application traces generated by an application. Computer-implemented methods and systems determine different sampling rates based on frequency of occurrence of trace types and/or frequency of occurrence of durations of the traces. Each sampling rate corresponds to a different trace type and/or different duration. The sampling rates for low frequency trace types and durations are larger than the sampling rates for high frequency trace types and durations. The relatively larger sampling rates for low frequency trace types and low frequency durations ensures that low frequency trace types and low frequency durations are sampled in sufficient numbers and are not passed over during sampling of the application traces. The set of sampled traces are stored in a data storage device.