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134 条记录 (耗时 0.015 秒)

    Stack marshaler
    132.
    发明申请
    Stack marshaler 有权

    公开(公告)号：US20060075393A1

    公开(公告)日：2006-04-06

    申请号：US10944095

    申请日：2004-09-17

    申请人： Oliver Schmidt

    发明人： Oliver Schmidt

    IPC分类号： G06F9/45

    CPC分类号： G06F9/544 ,  G06F9/461 ,  G06F9/52

    摘要： Systems and techniques for transferring the flow of control between agents. In one general aspect, a computer program product includes instructions operable to cause data processing apparatus to: store data on a first call stack, the first call stack corresponding to and being used by a first agent; suspend the first agent's use of the first call stack; enable a second agent to access the data by using the first call stack; and resume the first agent's use of the first call stack after the second agent is no longer using the first call stack. According to another aspect, a computer program product includes a first set of instructions that is operable to store and access data on a shared call stack; and a second set of instructions that is operable to alternate execution of the first set of instructions between a first agent and a second, distinct agent.

    Chip-size wavelength detector
    133.
    发明申请
    Chip-size wavelength detector 有权
    芯片尺寸波长检测器

    公开(公告)号：US20060039009A1

    公开(公告)日：2006-02-23

    申请号：US10922870

    申请日：2004-08-23

    申请人： Peter Kiesel ,  Oliver Schmidt ,  Oliver Wolst

    发明人： Peter Kiesel ,  Oliver Schmidt ,  Oliver Wolst

    IPC分类号： G01B9/02

    CPC分类号： G01J9/0246 ,  G01J3/26

    摘要： A chip-size wavelength detector includes a film with laterally varying transmission properties and a position-sensitive detector. The film transmits a different wavelength as a function of lateral position across the film. The position of a spot of light transmitted through the film will shift, depending on the wavelength of the light. The shift is measured by the position-sensitive detector.

    摘要翻译： 芯片尺寸波长检测器包括具有横向变化的透射特性的膜和位置敏感检测器。 薄膜透过不同的波长作为跨膜的横向位置的函数。 透过薄膜的光斑的位置将根据光的波长而移动。 位移由位置敏感检测器测量。

    Production of microscopic and nanoscopic coils, transformers and capacitors by rolling or folding over conductive layers during the removal of auxiliary layers from a substrate
    134.
    发明申请
    Production of microscopic and nanoscopic coils, transformers and capacitors by rolling or folding over conductive layers during the removal of auxiliary layers from a substrate 失效
    在从衬底去除辅助层期间通过滚动或折叠导电层来生产微观和纳米线圈，变压器和电容器

    公开(公告)号：US20050118733A1

    公开(公告)日：2005-06-02

    申请号：US10498278

    申请日：2002-11-12

    申请人： Oliver Schmidt ,  Christoph Deneke

    发明人： Oliver Schmidt ,  Christoph Deneke

    IPC分类号： B81B3/00 ,  H01F17/00 ,  H01F41/04 ,  H01L21/00 ,  H01L21/20 ,  H01L27/14 ,  H01L29/82 ,  H01L29/84

    CPC分类号： H01F41/041 ,  H01F17/0006 ,  Y10T29/49071 ,  Y10T29/49147 ,  Y10T29/49155 ,  Y10T29/49204 ,  Y10T29/49222

    摘要： Production of microscopic and nanoscopic coils, transformers and capacitors by rolling up conductor layers during the removal of auxiliary layers from a substrate By removing the auxiliary layer (3) from the substrate (1), for example by virtue of a sacrificial layer (2) situated in between being selectively etched away, the auxiliary layer (3) folds back and, if appropriate, automatically rolls up upon continuation of the removal operation and a conductor track (4) concomitantly rolls up in the process. The auxiliary layer (3) may be formed by two layers (3a, 3b) having different lattice constants. It is possible to produce microcoils, microtransformers or microcapacitors constructed from said microcoils, with diameters in the nanometers or micrometers range.

    摘要翻译： 通过在从衬底去除辅助层期间卷起导体层来生产微观和纳米线圈，变压器和电容器通过例如借助于牺牲层（2）从衬底（1）移除辅助层（3） 位于被选择性地蚀刻掉之前，辅助层（3）折回，并且如果合适的话，在继续移除操作时自动卷起，并且导体轨道（4）在该过程中同时卷起。 辅助层（3）可以由具有不同晶格常数的两层（3a，3b）形成。 可以生产直径在纳米或微米范围内的由所述微线圈构建的微线圈，微型变压器或微电容器。