公开(公告)号：US5706293A

公开(公告)日：1998-01-06

申请号：US650936

申请日：1996-05-17

申请人： Heon-cheol Kim ,  Ho-ryong Kim ,  Sang-hyeon Baeg ,  Chang-hyun Cho

发明人： Heon-cheol Kim ,  Ho-ryong Kim ,  Sang-hyeon Baeg ,  Chang-hyun Cho

IPC分类号： G06F11/22 ,  G11C29/10 ,  G06F11/00

CPC分类号： G11C29/10

摘要： The present invention provides a test method of SOA (Single-Order Addressed) memory utilizing address data backgrounds applied to memory circuits. A memory test operation is performed using a total of (log.sub.2 N+1) address data backgrounds on an SOA memory having N mutually different addresses. Each address data background is written and read, then the inversion is written and read. Finally the address data background is again written and read for a total of 6 N(log.sub.2 N+1) operations.

摘要翻译： 本发明提供了利用应用于存储器电路的地址数据背景的SOA（单次寻址）存储器的测试方法。 在具有N个相互不同的地址的SOA存储器上使用总共（log2N + 1）地址数据背景来执行存储器测试操作。 写入和读取每个地址数据背景，然后写入和读取反转。 最后，地址数据背景再次写入和读取总共6 N（log2N + 1）操作。