Leadframe-less laser direct structuring (LDS) package

    公开(公告)号:US12080631B2

    公开(公告)日:2024-09-03

    申请号:US17463140

    申请日:2021-08-31

    发明人: Luca Grandi

    摘要: The present disclosure is directed to a semiconductor package including a first laser direct structuring (LDS) resin layer and a second LDS resin layer on the first LDS resin layer. Respective surfaces of the first LDS resin layer and the second LDS resin layer are patterned utilizing an LDS process by exposing the respective surfaces to a laser. Patterning the first and second LDS resin layers, respectively, activates additive material present within the first and second LDS resin layers, respectively, converting the additive material from a non-conductive state to a conductive state. The LDS process is followed by a chemical plating step and an electrolytic plating process to form conductive structure coupled to a plurality of die within the first and second LDS resin layers. A molding compound layer is formed on surfaces of the conductive structures and covers the surfaces of the conductive structures. After these steps have been completed, the first LDS resin layer and the second LDS resin layer are singulated along channels filled with conductive material.

    DC-DC CONVERTER WITH GALVANIC ISOLATION AND CORRESPONDING METHOD OF CONTROL OF A DC-DC CONVERTER

    公开(公告)号:US20240291387A1

    公开(公告)日:2024-08-29

    申请号:US18437919

    申请日:2024-02-09

    摘要: Provided is a DC-DC converter with galvanic isolation comprising a resonant oscillator coupled to a primary winding of a galvanic isolation transformer. A rectifier is coupled to a secondary winding of the transformer to provide an output voltage. The DC-DC converter comprises a regulation loop configured to regulate an output voltage with respect to a reference voltage by controlling a current flowing in the resonant oscillator as a function of a result of a signal indicative of the comparison between the output voltage and the reference voltage. The resonant oscillator is configured to operate at a frequency, in particular tuned at sub-resonant point, in particular sub-harmonic frequency, below a resonance frequency of the resonant oscillator which maximizes a quality factor of the resonant oscillator, in particular below a resonance frequency of a LC tank circuit comprised in the resonant oscillator which maximizes a quality factor of the LC tank circuit.

    Circuit for biasing an external resistive sensor

    公开(公告)号:US12073860B2

    公开(公告)日:2024-08-27

    申请号:US18191639

    申请日:2023-03-28

    IPC分类号: G11B5/60 H03F1/02

    摘要: According to an embodiment, a circuit includes a biasing and a low-frequency recovery circuit. The biasing circuit includes a voltage digital to analog converter (V-DAC), a differential difference amplifier coupled to the V-DAC, a common-mode feedback (CMFB) amplifier coupled to the differential difference amplifier, and a first pair of transistors arranged as a high-impedance structure and coupled to the differential difference amplifier and the CMFB amplifier. The low-frequency recovery circuit includes a current digital to analog converter (C-DAC), a second pair of transistors arranged as a high-impedance structure and coupled to the first pair of transistors, a pair of resistors having a resistance value equal to half a resistance of the resistive sensor, the pair of resistors arranged between the second pair of transistors and coupled to the C-DAC, and a gain circuit coupled to shared nodes between the second pair of transistors and the pair of resistors.

    System for testing an electronic circuit and corresponding method and computer program product

    公开(公告)号:US12072372B2

    公开(公告)日:2024-08-27

    申请号:US17903344

    申请日:2022-09-06

    IPC分类号: G01R31/28

    CPC分类号: G01R31/2834

    摘要: A system, method, and device to test an electronic circuit are disclosed having a stage to supply a driving signal to a load comprising a pull-up switch and a pull-down switch and a pre-driver stage including pre-driver circuits. The electronic circuit including circuits for testing the pre-driver stage under the control of an automatic testing equipment (ATE) to operate a built-in self-test sequence including test commands for the pre-driver stage under the control of an external test signal issued by the ATE. The system includes a time measuring circuit to measure duration of signals at the output of the stage coupled to a pass-fail check circuit, and to evaluate if the duration of signals at the output of the stage to determine whether the output satisfies a pass criterion.