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公开(公告)号：US08587573B2
公开(公告)日：2013-11-19
申请号：US12735930
申请日：2009-02-05
申请人： Toshio Watanabe , Shinsuke Anzai , Yoshihiro Nakatani , Hiroaki Fujino , Hirofumi Matsui , Masami Mori , Kohichi Hosokawa
发明人： Toshio Watanabe , Shinsuke Anzai , Yoshihiro Nakatani , Hiroaki Fujino , Hirofumi Matsui , Masami Mori , Kohichi Hosokawa
IPC分类号： G06F3/038
CPC分类号： G09G3/3688 , G09G3/2011 , G09G2310/027 , G09G2310/0291 , G09G2310/0297 , G09G2330/08 , G09G2330/12
摘要： A driving circuit of at least one embodiment includes: m output terminals; m+1 video signal output sections including m+1 output circuits, respectively; a decision section for determining the quality of each of the video signal output sections; and switches for switching connections between the output terminals and the video signal output sections in accordance with a result of determination made by the decision section. When the decision section has determined the ith (i being a natural number of m or less) video signal output section to be defective, the switches connect the jth (j being a natural number of i−1 or less) video signal output section to the jth output terminal and connect the (k+1)th (k being a natural number of i or more to m or less) video signal output section to the kth output terminal. Thus provided is a driving circuit, capable of self-repairing a defective one of the video signal output sections, which has more simplified wires connected to the video signal output sections.
摘要翻译： 至少一个实施例的驱动电路包括：m个输出端子; m + 1个视频信号输出部分分别包括m + 1个输出电路; 确定部分，用于确定每个视频信号输出部分的质量; 以及用于根据决定部分做出的确定的结果来切换输出端子和视频信号输出部分之间的连接。 当决定部分确定第i（i个m个或更少的自然数）视频信号输出部分为有缺陷时，该开关将第j个（j是i-1或更小的自然数）视频信号输出部分连接到 第j个输出端子，并将第（k + 1）（k为i以上的自然数〜m以下）视频信号输出部连接到第k个输出端子。 这样提供了一种驱动电路，其能够自我修复视频信号输出部分中的有缺陷的一个，其具有连接到视频信号输出部分的更简化的线。
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公开(公告)号：US07020037B2
公开(公告)日：2006-03-28
申请号：US11051139
申请日：2005-02-04
申请人： Shinsuke Anzai , Yasumichi Mori
发明人： Shinsuke Anzai , Yasumichi Mori
IPC分类号： G11C7/02
CPC分类号： G11C16/28 , G11C11/5642 , G11C11/5678 , G11C11/5685 , G11C13/0004 , G11C13/0007 , G11C13/004 , G11C13/0064 , G11C16/3436 , G11C2013/0054 , G11C2213/31
摘要： A nonvolatile semiconductor memory device includes a readout circuit which reads data stored in a selected memory cell by applying predetermined voltage to the selected memory cell and a reference cell such that currents corresponding to the respective threshold voltage may flow, and comparing the current flowing in the selected memory cell with the current flowing in the reference cell. The readout circuit commonly uses the reference cell set in the same storage state for normal readout and for readout for program verification, and when the predetermined voltage is applied to the selected memory cell and the reference memory cell at the time of the readout for the program verification, it sets an applying condition to the reference memory cell such that its storage state may be shifted more in the program state direction than that in an applying condition at the time of the normal readout.
摘要翻译： 非易失性半导体存储器件包括：读出电路，通过向所选择的存储单元施加预定电压，读取存储在所选择的存储单元中的数据;以及参考单元，使得与各个阈值电压相对应的电流可以流动， 选定的存储单元，电流在参考单元中流动。 读出电路通常使用相同存储状态的参考单元设置用于正常读出和用于程序验证的读出，并且当在用于程序的读出时将预定电压施加到所选择的存储单元和参考存储单元时 验证时，将参考存储单元的应用条件设置为使得其存储状态可以在程序状态方向上比在正常读出时的应用条件中更多地移位。
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公开(公告)号：US09830026B2
公开(公告)日：2017-11-28
申请号：US14128910
申请日：2012-05-08
IPC分类号： G06F3/044 , G06F3/041 , G06F3/0488
CPC分类号： G06F3/044 , G06F3/0418 , G06F3/04883 , G06F3/04886 , G06F2203/04112 , H04M2250/22
摘要： A touch panel system (611) includes a touch invalidating section (609) which, in a case where a specific point of the sensor panel (601) is continuously touched for a predetermined period of time, invalidates an instruction given, in accordance with the touch, to a host computer (610). Furthermore, the touch invalidating section (609) invalidates an instruction corresponding to a next touch on the point.
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公开(公告)号：US09152286B2
公开(公告)日：2015-10-06
申请号：US14368694
申请日：2012-04-09
CPC分类号： G06F3/044 , G06F3/041 , G06F3/0418 , G06F3/048 , G06F3/0488 , G06F2203/04112
摘要： A touch panel system (11) prevents an incorrect operation caused by an unintended contact of an object with a touch panel while suppressing a decline in sensitivity of detection of presence or absence of a touch on the touch panel. The touch panel system (11) includes a touch invalidating section (9) which, in a case where a specific point of a touch panel (1) is continuously touched for a predetermined period of time, invalidates an instruction that is given, in accordance with the touch, to an electronic apparatus including the touch panel (1).
摘要翻译： 触摸面板系统（11）防止由触摸面板上的物体意外接触引起的不正确的操作，同时抑制触摸面板上触摸的存在或不存在的检测灵敏度的下降。 触摸面板系统（11）包括触摸无效部分（9），其在触摸面板（1）的特定点持续触摸预定时间段的情况下，使根据该给定的指令无效 触摸到包括触摸面板（1）的电子设备。
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公开(公告)号：US20140375608A1
公开(公告)日：2014-12-25
申请号：US14368694
申请日：2012-04-09
IPC分类号： G06F3/044
CPC分类号： G06F3/044 , G06F3/041 , G06F3/0418 , G06F3/048 , G06F3/0488 , G06F2203/04112
摘要： A touch panel system (11) prevents an incorrect operation caused by an unintended contact of an object with a touch panel while suppressing a decline in sensitivity of detection of presence or absence of a touch on the touch panel. The touch panel system (11) includes a touch invalidating section (9) which, in a case where a specific point of a touch panel (1) is continuously touched for a predetermined period of time, invalidates an instruction that is given, in accordance with the touch, to an electronic apparatus including the touch panel (1).
摘要翻译： 触摸面板系统（11）防止由触摸面板上的物体意外接触引起的不正确的操作，同时抑制触摸面板上触摸的存在或不存在的检测灵敏度的下降。 触摸面板系统（11）包括触摸无效部分（9），其在触摸面板（1）的特定点持续触摸预定时间段的情况下，使根据该给定的指令无效 触摸到包括触摸面板（1）的电子设备。
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公开(公告)号：US20100225635A1
公开(公告)日：2010-09-09
申请号：US12225182
申请日：2008-05-26
IPC分类号： G06F3/038
CPC分类号： G09G3/20 , G09G3/006 , G09G3/3648 , G09G2310/027 , G09G2310/0278 , G09G2330/08 , G09G2330/12
摘要： In one embodiment of the present invention, a liquid crystal driving semiconductor IC for driving a display panel includes an output terminal connected to the display panel, an output circuit block including a DAC circuit, and a spare output block including a DAC circuit, the DAC circuits and being connectable to the output terminal. The IC includes an op amp for comparing output signal from the DAC circuit with that of the DAC circuit, and judging circuit for judging, based on the comparison result of the op amp, whether the DAC circuit is defective, and switches and for, if the DAC circuit is defective, connecting the spare DAC circuit to the output terminal in replacement of the defective DAC circuit. This provides an IC for driving a display device, which IC has concrete measures to easily detect a defect in an output circuit, and can perform self-healing for the defect in the output circuit.
摘要翻译： 在本发明的一个实施例中，用于驱动显示面板的液晶驱动半导体IC包括连接到显示面板的输出端子，包括DAC电路的输出电路块和包括DAC电路的备用输出块，DAC 电路并可连接到输出端子。 IC包括用于比较来自DAC电路的输出信号与DAC电路的输出信号的运算放大器，以及用于基于运算放大器的比较结果判断DAC电路是否有故障的判断电路，以及用于如果 DAC电路有故障，将备用DAC电路连接到输出端子，以代替有缺陷的DAC电路。 这提供了用于驱动显示装置的IC，该IC具有能够容易地检测输出电路中的缺陷的具体措施，并且可以对输出电路中的缺陷执行自愈。
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公开(公告)号：US06947322B2
公开(公告)日：2005-09-20
申请号：US10630641
申请日：2003-07-29
申请人： Shinsuke Anzai , Yasumichi Mori , Hidehiko Tanaka
发明人： Shinsuke Anzai , Yasumichi Mori , Hidehiko Tanaka
IPC分类号： G06F12/16 , G11C11/56 , G11C16/00 , G11C16/02 , G11C16/06 , G11C16/28 , G11C29/00 , G11C29/04 , G11C16/04
CPC分类号： G11C11/5642 , G11C7/06 , G11C16/28 , G11C29/70 , G11C2211/5623 , G11C2211/5641
摘要： A semiconductor memory device is provided, which comprising a memory cell array comprising a two-value memory region and a multi-value memory region, in which the two-value memory region comprises a plurality of memory cells each storing 1-bit data and the multi-value memory region comprises a plurality of memory cells each storing 2 or more-bit data, and a sense amplifier section common to data read of the two-value memory region and data read of the multi-value memory region, for reading data stored in a selected memory cell by comparing a potential of the selected memory cell with a reference potential.
摘要翻译： 提供一种半导体存储器件，其包括存储单元阵列，该存储单元阵列包括二值存储区域和多值存储器区域，其中该二值存储器区域包括多个存储单元，每个存储器单元存储1位数据， 多值存储区包括多个存储2位或更多比特数据的存储单元，以及读出两值存储区域的数据和多值存储器区域的数据读出共同的读出放大器单元，用于读取数据 通过将所选择的存储器单元的电位与参考电位进行比较来存储在所选存储单元中。
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公开(公告)号：US20110199355A1
公开(公告)日：2011-08-18
申请号：US12735930
申请日：2009-02-05
申请人： Toshio Watanabe , Shinsuke Anzai , Yoshihiro Nakatani , Hiroaki Fujino , Hirofumi Matsui , Masami Mori , Kohichi Hosokawa
发明人： Toshio Watanabe , Shinsuke Anzai , Yoshihiro Nakatani , Hiroaki Fujino , Hirofumi Matsui , Masami Mori , Kohichi Hosokawa
IPC分类号： G06F3/038
CPC分类号： G09G3/3688 , G09G3/2011 , G09G2310/027 , G09G2310/0291 , G09G2310/0297 , G09G2330/08 , G09G2330/12
摘要： A driving circuit of at least one embodiment includes: m output terminals; m+1 video signal output sections including m+1 output circuits, respectively; a decision section for determining the quality of each of the video signal output sections; and switches for switching connections between the output terminals and the video signal output sections in accordance with a result of determination made by the decision section. When the decision section has determined the ith (i being a natural number of m or less) video signal output section to be defective, the switches connect the jth (j being a natural number of i−1 or less) video signal output section to the jth output terminal and connect the (k+1)th (k being a natural number of i or more to m or less) video signal output section to the kth output terminal. Thus provided is a driving circuit, capable of self-repairing a defective one of the video signal output sections, which has more simplified wires connected to the video signal output sections.
摘要翻译： 至少一个实施例的驱动电路包括：m个输出端子; m + 1个视频信号输出部分，分别包括m + 1个输出电路; 确定部分，用于确定每个视频信号输出部分的质量; 以及用于根据决定部分做出的确定的结果来切换输出端子和视频信号输出部分之间的连接。 当决定部分确定第i（i个m个或更少的自然数）视频信号输出部分为有缺陷时，该开关将第j个（j是i-1或更小的自然数）视频信号输出部分连接到 第j个输出端子，并将第（k + 1）（k为i以上的自然数〜m以下）视频信号输出部连接到第k个输出端子。 这样提供了一种驱动电路，其能够自我修复视频信号输出部分中的有缺陷的一个，其具有连接到视频信号输出部分的更简化的线。
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公开(公告)号：US20050174868A1
公开(公告)日：2005-08-11
申请号：US11051139
申请日：2005-02-04
申请人： Shinsuke Anzai , Yasumichi Mori
发明人： Shinsuke Anzai , Yasumichi Mori
CPC分类号： G11C16/28 , G11C11/5642 , G11C11/5678 , G11C11/5685 , G11C13/0004 , G11C13/0007 , G11C13/004 , G11C13/0064 , G11C16/3436 , G11C2013/0054 , G11C2213/31
摘要： A nonvolatile semiconductor memory device comprises a readout circuit which reads data stored in a selected memory cell by applying predetermined voltage to the selected memory cell and a reference cell such that currents corresponding to the respective threshold voltage may flow, and comparing the current flowing in the selected memory cell with the current flowing in the reference cell. The readout circuit commonly uses the reference cell set in the same storage state for normal readout and for readout for program verification, and when the predetermined voltage is applied to the selected memory cell and the reference memory cell at the time of the readout for the program verification, it sets an applying condition to the reference memory cell such that its storage state may be shifted more in the program state direction than that in an applying condition at the time of the normal readout.
摘要翻译： 非易失性半导体存储器件包括读出电路，其通过向所选择的存储单元施加预定电压来读取存储在所选择的存储单元中的数据，以及参考单元，使得可以流过对应于相应阈值电压的电流，并且比较流过 选定的存储单元，电流在参考单元中流动。 读出电路通常使用相同存储状态的参考单元设置用于正常读出和用于程序验证的读出，并且当在用于程序的读出时将预定电压施加到所选存储单元和参考存储单元时 验证时，将参考存储单元的应用条件设置为使得其存储状态可以在程序状态方向上比在正常读出时的应用条件中更多地移位。
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