Optical debug mechanism
    11.
    发明申请
    Optical debug mechanism 审中-公开
    光学调试机制

    公开(公告)号:US20070237527A1

    公开(公告)日:2007-10-11

    申请号:US11394697

    申请日:2006-03-31

    IPC分类号: H04B10/04

    摘要: A method for performing analysis of electrical signals in a system is disclosed. The system includes at least two circuit elements between which an electrical signal is transmitted. The method converts the electrical signal to dual optical signals, one of which is converted back to an electrical signal for receipt by the intended circuit element. The second optical signal may be transmitted a great distance, relative to electrical signals, allowing for remote analysis of the signal. The loss in converting the electrical signal to an optical signal, then back to an electrical signal is low compared to other debug methods. The method may be performed with high-speed signals.

    摘要翻译: 公开了一种用于执行系统中电信号分析的方法。 该系统包括至少两个电路元件,在其间传输电信号。 该方法将电信号转换为双光信号,其中一个信号被转换回电信号以供预期的电路元件接收。 相对于电信号,第二光信号可以被传送很远的距离,允许远程分析信号。 与其他调试方法相比,将电信号转换为光信号,然后返回电信号的损耗较低。 该方法可以用高速信号执行。