Method and device for testing electronic components
    11.
    发明授权
    Method and device for testing electronic components 有权
    电子元件测试方法和装置

    公开(公告)号:US06504359B2

    公开(公告)日:2003-01-07

    申请号:US09768393

    申请日:2001-01-24

    申请人: Jens Polney

    发明人: Jens Polney

    IPC分类号: G01R3126

    摘要: A method for testing electronic components includes the step of outputting test output data for the tested electronic components on a test board without activating individual scan lines or individual scan signals. Starting from a first activated electronic component successively the following electronic components are activated one after another by passing an activation signal from electronic component to electronic component. A device for testing electronic components is also provided.

    摘要翻译: 用于测试电子部件的方法包括在测试板上输出测试的电子部件的测试输出数据而不激活单独的扫描线或单独的扫描信号的步骤。 从第一激活的电子部件开始,通过将激活信号从电子部件传递到电子部件,依次激活以下电子部件。 还提供了一种用于测试电子部件的装置。