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公开(公告)号:US20190042139A1
公开(公告)日:2019-02-07
申请号:US16117157
申请日:2018-08-30
Applicant: Intel Corporation
Inventor: Brennan Watt , Joseph Tarango , Swetha Natham
IPC: G06F3/06
Abstract: An embodiment of a semiconductor apparatus may include technology to track defect information related to a persistent storage media, and determine a best next candidate for background clean-up of the persistent storage media based on the tracked defect information. Other embodiments are disclosed and claimed.