公开(公告)号：US20210341352A1

公开(公告)日：2021-11-04

申请号：US17271258

申请日：2018-08-31

Applicant: NEC Corporation

Inventor： Shohei KINOSHITA ,  Shigeru KASAI ,  Yu KIYOKAWA

IPC: G01M7/02 ,  G01M5/00

Abstract: A diagnosis apparatus 1 includes: a generation unit 2 configured to acquire vibration information indicating vibration produced in a structure 20 from a plurality of sensors 21 provided to the structure 20, and to generate, using the vibration information, natural vibration mode information indicating a natural vibration mode shape; an occurrence rate calculation unit 3 configured to calculate a rate of occurrence of a normal natural vibration mode shape based on the number of times vibration was applied to the structure 20 and the number of times the normal natural vibration mode shape was generated when the vibration was applied; and a diagnosis unit 4 configured to diagnose whether or not repair and reinforcement performed on the structure were effective based on the rate of occurrence and a reference value.

公开(公告)号：US20210010897A1

公开(公告)日：2021-01-14

申请号：US16981529

申请日：2018-03-23

Applicant: NEC Corporation

Inventor： Yu KIYOKAWA ,  Shigeru KASAI ,  Shohei KINOSHITA

IPC: G01M7/02

Abstract: An abnormality diagnosis apparatus including: a feature amount calculation unit 2 configured to perform, on mode vectors generated based on vibration of a structure 20 measured by sensors 21, normalization of amplitude components and normalization for removing an initial phase from phase components, and calculate amplitude feature amounts corresponding to the amplitude components and phase feature amounts corresponding to the phase components; and an abnormality detection unit 3 configured to specify an abnormality in the structure 20 based on the amplitude feature amounts and the phase feature amounts.