公开(公告)号：US06177804B1

公开(公告)日：2001-01-23

申请号：US09205025

申请日：1998-12-03

Applicant: Neven Pischl ,  John Lockwood

Inventor： Neven Pischl ,  John Lockwood

IPC: G01R2728

CPC classification number: G01R1/067 ,  G01R29/0878

Abstract: According to one embodiment of the present invention, a voltage probe for measuring common-mode (CM) voltage of a device under test (DUT) having differential input/output (I/O) signals is disclosed. The probe includes a connector adapted to couple to the DUT, at least one output measurement port configured to connect to a measuring device for measuring the CM voltage, and at least one differential pair cable connected to a connector and to a at least one measurement port for coupling a differential I/O signals to a measurement port. According to a second embodiment, the present invention provides a voltage probe for measuring CM voltage of a DUT having differential I/O signals while the DUT is simultaneously connected to an auxiliary equipment. According to a third embodiment, the present invention provides a method for measuring EMI from a DUT. A CM voltage probe is interposed between the DUT and an EMI measurement device. The CM voltage is measured at an measurement port of the voltage probe. The measured CM voltage is compared to a limit for EMI.

Abstract translation: 根据本发明的一个实施例，公开了一种用于测量具有差分输入/输出（I / O）信号的待测器件（DUT）的共模（CM）电压的电压探针。 探头包括适于耦合到DUT的连接器，配置成连接到用于测量CM电压的测量装置的至少一个输出测量端口以及连接到连接器和至少一个测量端口的至少一个差分对电缆 用于将差分I / O信号耦合到测量端口。 根据第二实施例，本发明提供一种用于在DUT同时连接到辅助设备的同时测量具有差分I / O信号的DUT的CM电压的电压探针。 根据第三实施例，本发明提供了一种用于从DUT测量EMI的方法。 在DUT和EMI测量装置之间插入一个CM电压探头。 在电压探头的测量端口处测量CM电压。 将测量的CM电压与EMI的限制进行比较。